Glancing Incidence X-ray scattering is used to determine structural and chemical variations within thin films. This information can be used to model the structural evolution of different films and/or to compare with existing models that predict the presence of strain and domain patterns. In addition, the results can be compared with electrical/optoelectronic measurements in order to relate these to the structure of the films. This can be used in turn to optimize applications. This talk will present examples of recent measurements performed in our group involving ferroelectric films and/or liquid crystal ferroelectric films.