CESR/CLEO Interaction Region and Simulation

D. Cinabro, Wayne State University

Talk given at Keystone Workshop on Physics and Detectors for Future e+e- Linear Colliders. The talk was at the Interaction Region, Backgrounds session on Sunday 27 September 1998.

  1. Introduction
  2. CESR Conditions
  3. CLEO III Beam Pipe Description
  4. CLEO III Beam Pipe Assembly
  5. Order 10 micron Sputter Coating
  6. CLEO II.V Beam Pipe Gold Thickness Profile
  7. CLEO III Beam Pipe Gold Thickness Profile
  8. Picture of CLEO II.V Beam Pipe showing the gold coating
  9. Remotely Closed UHV Flange
  10. CLEO III Interaction Region View
  11. Schematic of the flange
  12. Picture of Flange prototype
  13. Magic Flange Issues
  14. CESR/CLEO Background Simulation
  15. Source Effectiveness on Silicon Layer 1
  16. Highlights of our Background Machine Studies Program
  17. Pressure Profiles 1-4 With Calibrated Leak
  18. Pressure Profiles 5-8 With Calibrated Leak
  19. Interaction Region Radiation Level for Calibrated Leak Pressure Profiles
  20. Pressure Profile for Normal HEP Running
  21. Interaction Region Radiation Level versus HEP Beam Current
  22. Occupancy in Silicion Layer 1 versus HEP Beam Current
  23. Occupancy in Silicion Layer 2 versus HEP Beam Current
  24. Occupancy versus Tracking Layer at HEP Beam Current = 300 mA
  25. Keys to Success at Simulating Beam Induced Backgrounds
  26. Wide Angle Beamstrahlung as a Beam Diagnostic: Beam Pathologies
  27. Wide Angle Beamstrahlung Signal verus Beam Pathology
  28. Conclusion

Thanks to Dawn Isabel for helping to scan in the transparencies, converting them, and helping to make this page.

Last modified: Fri Oct 9 11:04:28 EDT 1998